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Electronic project automation (EDA) is the category of information for designing & producing electronic systems ranging from either printed circuit boards (PCBs) to integrated circuits. This is every now and again known as ECAD (electronic computer-aided design).
A term EDA is likewise utilized as an umbrella term for computer-aided engineering, computer-aided design and computer-aided manufacturing of electronics in the discipline of electrical engineering. This usage probably originates in the IEEE Design Automation Technical Committee.
EDA has speedily increased around importance sustaining a continuous scaling of semiconductor technology. (View: Moore's Law.) The largest segment of EDA users are chip designers at semiconductor companies, who design chips using EDA software. Metalworks operators (world health organization actually begin a fabs) & project-service corporations as well have EDA package to evaluate an incoming project for manufacturing readiness.
Product areas (incomplete)
EDA is divided into numerous (periodically overlapping) sub-areas. It mostly align by owning a path of manufacturing of the chips from either project to mask generation.
Design and Architecture: design a chip's schematics, output in Verilog, VHDL, SPICE and other formats.
Floorplanning: a preparation step of creating the basic die-map showing the potential locations for gate, power & ground planes, I/O pads, and hard macros. (This is correspondent to the city-planner's activity inside creating residential, commercial, & industrial zones in the block.)
Logic synthesis: translation of a chip's (abstract) RTL-description (Verilog or VHDL) into the discrete netlist of logic-gate (boolean-logic) primitives
Behavioral Synthesis, High Level Synthesis or Algorithmic Synthesis: This takes a level of abstraction higher & allows automation of the architecture exploration run. It involves the run of translating an abstract behavioural description of a project to synthesizeable RTL. A input specification is around languages rather behavioural VHDL, algorithmic SystemC, C++ etc & a RTL description around VHDL/Verilog is produced when a effect of synthesis.
Intellectual property blocks: provide pre-programmed design elements.
Simulation: simulate circuit's work & detect any shortcomings
Transistor Simulation – sale-subordinate transistor-simulation of the schematic/layout's behavior, precise at device-level
RTL Simulation – digital-simulation of an RTL or circuit-netlist's digital (boolean 0/1) behavior, precise at boolean-level
Behavioral Simulation – high-level sim of the project's architectural operation, exact at period-level or even interface-level
Formal verification: algorithmic-comparison between a chip's RTL-description & synthesized gate-netlist, to assure equivalency at a logical level
Place and route, PR: (for digital devices) thing-automated placement of logic-gates of the synthesized gate-netlist, so subsequent wiring of the gates' signal & power terminals.
Electronic transistor layout: (for analog/mixed-signal gear), periodically known as polygonal shape pushing – the prepared-schematic is converted into a layout-map showing tons shells of the device (doping, interconnect)
Physical verification, PV: checking if project is physically manufacturable & ensuant chips might non use any functioning preventing physical defects & meet original specifications
Design rules checking, DRC – checks number of system of geometrical & connectivity nature and severity specified by manufacturer
Layout versus schematic, LVS – checks if intentional chip layout matches schematic drawing from either specification
Parasitic device extraction, RCX – extracts parasitic resistors (PRE), & typically capacitance (RCX), and every now and again inductance, inherent in the chip layout
Mask data preparation, MDP: generation of actual lithography photomask used to physically manufacture the chip
Resolution enhancement techniques, RET – methods of increasing of quality of final photomask
Optical proximity correction, OPC – up-front compensation for diffraction and interference effects occurring later once chip is made applying this mask
Mask generation – generation of flat mask image from hierarchal design
Manufacturing Test
design for test, DFT – adds logic-structures to a gate-netlist, to help post-fabrication (die/wafer) defect testing
automated test pattern generation, ATPG – generates pattern-data to consistently exercise when numbers of logic-gates when possible
Largest companies
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